WALTER KOSONOCKY AWARD
Recipients
The IISS Walter Kosonocky Award is presented biennially for THE BEST PAPER presented in any venue during the prior two years representing significant advancement in solid-state image sensors. The award commemorates the many important contributions made by the late Dr. Walter Kosonocky to the field of solid-state image sensors. Personal tributes to Dr. Kosonocky appeared in the IEEE Transactions on Electron Devices in 1997.
Founded in 1997 by his colleagues in industry, government and academia, the award is also funded by proceeds from the International Image Sensor Workshop. The award committee solicits nominations biennially. The award is announced and presented at the Workshop.
| Year/Org. | Recipients | Recipients | Paper |
| 2023
Canon Inc. |
K. Morimoto
J. Iwata M. Shinohara H. Sekine A. Abdelghafar H. Tsuchiya Y. Kuroda K. Tojima W. Endo Y. Maehashi Y. Ota T. Sasago S. Maekawa |
S. Hikosaka
T. Kanou A. Kato T. Tezuka S. Yoshizaki T. Ogawa K. Uehira A. Ehara F. Inui Y. Matsuno K. Sakurai T. Ichikawa |
3.2 Megapixel 3D-Stacked Charge Focusing SPAD for Low-Light Imaging and Depth Sensing
2021 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, 2021, pp. 20.2.1-20.2.4 |
| 2021
STMicroelectronics, IMEP-LaHC, Univ. Grenoble Alpes, |
Francois Roy Andrej Thomas Romain Daniel Jihane |
Yvon Cazaux Catherine Laurent Panagiota Guo-Neng |
Fully Depleted, Trench-Pinned Photo Gate for CMOS Image Sensor Applications
MDPI Sensors, Vol.20, No3. Article No.727, pp.1-8, Jan 2020. |
| 2019
Sony |
Sozo Yokogawa Itaru Harumi Yoshiki Tomoyuki |
Suguru Saito Takashi Yoshiya Hayato |
IR sensitivity enhancement of CMOS Image Sensor with diffractive light trapping pixels
Scientific Reports, Vol. 7, Article No. 3832, pp. 1-9, June 2017. |
| 2017
Microsoft |
Cyrus S. Bamji Patrick Tamer Swati Barry Lawrence A. Dane |
Onur Can Akkaya Andy Andrew D. Travis Mike Vei-Han |
A 0.13 μm CMOS System-on-Chip for a 512 × 424 Time-of-Flight Image Sensor With Multi-Frequency Photo-Demodulation up to 130 MHz and 2 GS/s ADC
IEEE JSSC, Vol. 50, No. 1, pp. 303-318, January 2015. |
| 2015
Sony |
Shunichi Sukegawa Tsutomu Ken Tsutomu Koji Keishi Takashi Teruo |
Taku Umebayashi Hiroshi Isao Masanori Toshifumi Hiroshi Yoshikazu Noriyuki |
A 1/4-inch 8Mpixel Back-Illuminated Stacked CMOS Image Sensor
ISSCC Dig. Tech. Papers, pp. 484 – 485, Feb. 2013. |
| 2013
NHK Shizuoka University |
Kazuya Kitamura Toshihisa Takehide Tomohiko Tomoyuki Tetsuya Keigo |
Takashi Watanabe Hiroshi Hiroshi Satoshi Shoji Norifumi |
A 33-Megapixel 120-Frames-Per-Second 2.5-Watt CMOS Image Sensor With Column-Parallel Two-Stage Cyclic Analog-to-Digital Converters
IEEE Transactions On Electron Devices, 59(12), December 2012, pp. 3426-3433. |
| 2011
Sony |
Hayato Wakabayashi Keiji Masafumi Souichiro Oichi Seijiro Masamichi Masahiro Masaru Yuuki |
Takeshi Shikanai Ken Keiji Yasushi Kentaro Eiji Tomoyuki Masanori Tetsuo |
A 1/2.3-inch 10.3Mpixel 50 frame/s Back-Illuminated CMOS Image Sensor
Proc. 2010 International Solid-State Circuits Conference (ISSCC), pp. 410-411, San Francisco, CA USA February 2010. |
| 2009
Eastman |
Eric Stevens Hung Jeffery Gang Jian |
Hirofumi Komori Hiroaki Christopher Cristian |
Low Crosstalk and Low Dark Current CMOS Image Sensor Technology Using a Hole-Based Detector
Proc. International Solid-State Circuits Conference (ISSCC), pp.59-61 San Francisco, California USA February 2008. |
| 2007
Sony |
Satoshi Yoshihara Yoshikazu Masaru Ken Yoshiharu Yoshiaki Souichiro Hayato Masafumi |
Hiromi Kuriyama Junichi Akari Tadashi Yoshiharu Fumihiko Yasuo Shinya Tetsuo |
A 1/1.8” 6.4 Mpixel 60 frames/s CMOS image sensor with seamless mode change
IEEE J. of Solid-State Circuits, vol. 41(12) December 2006 pp. 2998-3006 |
| 2005
Micron Technology |
Alex Krymski Nail |
Howard Rhodes |
A 2 Electron noise, 1.3. Megapixel CMOS Sensor
Proc. 2003 IEEE Workshop on CCDs and Advanced Image Sensors, May 15-17, 2003 Bavaria, Germany |
| 2003
Texas Instruments |
Jaroslav Hynecek |
Impactron – A New Solid State Image Intensifier
IEEE Trans. Electron Devices, vol. 48(10) Oct. 2001 pp. 2238-2241 |
|
| 2001
Fujifilm |
Tetsuo Yamada Katsumi Yong-Gwan Hideki Tetsuo Tomohiro |
Kazuki Ogawa Eiichi Kazuyuki Kazuya Masafumi |
A Progressive Scan CCD Image Sensor for DSC Applications
IEEE J. Solid-State Circuits, vol. 35(12) Dec. 2000 pp. 2044-2054 |
| 1999
Philips |
Jan Bosiers Agnes Arjen Laurens Daniel |
Herman Peek Edwin Anco Frans Peter |
A 2/3” 2M pixel progressive scan FT-CCD for digital still camera applications
Proc. 1998 IEEE International Electron Devices Meeting, pp. 37-40 |