2003 IEEE Workshop on CCDs and Advanced Image Sensors

Schloss Elmau, Elmau, Bavaria, Germany

May 15-17, 2003

PROGRAM

Thursday May 15th 2003

08:30-08:50	Opening remarks
08:50-09:20	A 2e Noise 1.3 Megapixel CMOS Sensor Alex Krymski, Nail Khaliullin, Howard Rhodes (2005 Walter Kosonocky Award Winners), Micron Imaging.
09:20-09:40	Organic Photoconductive Films with Wavelength Selectivities S. Aihara, Y. Hirano, T. Tajima, K. Tanioka, M. Abe, N. Saito, N. Kamata, D. Terunuma, NHK.
09:40-10:00	A Multi-Resolution 100 GOPS 4 Gpixels/s Programmable CMOS Image Sensor for Machine Vision Robert Johansson, Leif Lindgren, Johan Melander, Bjoern Moeller, IVP.
10:00-10:30	Coffee Break
10:30-10:50	Dark current characterization of the CMOS APS imagers fabricated using a 0.18 um CMOS technology Hyuck In Kwon. In Man Kang, Byung-Gook Park, Jong Duk Lee, Sang Sik Park, Seoul National University.
10:50-11:10	A CMOS Image Sensor with Gain-Adaptive Column Amplifiers Masaki Sakakibara, Shoji Kawahito, Dwi Handoko, Nobuo Nakamura, Hiroki Satoh, Mizuho Higashi, Keiji Mabuchi, Hirofumi Sumi, Shizuoka University.
11:10-11:25	248-nm UV Damage Mechanism in MPP CCD’s Nixon O., Jonathan Huras, Sukhbir Kullar, Saladin Sahinovic, DALSA.
11:25-11:40	3-D Optical and Electrical Simulation for CMOS Image Sensors Hideki Mutoh, Link Research.
11:40-12:00	Electroluminescence and Impact Ionization in CMOS Active Pixel Sensors S. Maestre, P. Magnan, SUPAERO.
12:00-14:00	Lunch Break
14:00-14:30	Process and Pixels for High Performance Imager in SOI-CMOS Technology Xinyu Zheng, Suresh Seshadri, Michael Wood, Chris Wrigley, Bedabrata Pain, JPL.
14:30-14:50	Characterization of Dark Current in CMOS Image Sensors Hein Otto Folkerts, Joris P.V. Maas, Daniel W.E. Verbugt, Adri J. Mierop, Willem Hoekstra, Natalia V. Loukianova, Edwin Roks, Philips Semiconductors.
14:50-15:10	Fabrication of Avalanche Multiplication type CMOS Imager using a-Si:H photodiode film M. Akiyama, M.Hanada, H. Takao, K. Sawada, M. Ishida, Toyohashi University.
15:10-15:40	Design Consideration of FPN suppression circuit for a 1.25″ 8.3M-pixel digital output CMOS APS M. Shirakawa, T. Yamashita, K. Mitani, M. Sugawara, I. Takayanagi, J. Nakamura, S. Iversen, J. Moholt, E.R. Fossum, NHK.
15:40-16:10	Coffee Break
16:10-16:20	Introduction poster session
16:20-16:24	Programmable sensitivity image sensor with multi-capacitance CMOS pixels Ryutaro. Oi, Kiyoharu. Aizawa, University of Tokyo.
16:24-16:28	Analysis of potentialities of backside-illuminated thinned CMOS imagers C. Marques-Vatus, P. Magnan, SUPAERO.
16:28-16:32	CCD Detection of 157 nm Photons Flora Li, Nixon O, Arokia Nathan, University of Waterloo.
16:32-16:36	FAPS: A CMOS Sensors with multiple storage for fast imaging scientific applications R. Turchetta, Rutherford Appleton Lab.
16:36-16:40	Empirical Characterization of Lateral Crosstalk for CMOS Image Sensors and Restorative Deblurring Operations (WITHDRAWN) J.S. Lee, J. Shah, R.I. Hornsey, University of Waterloo.
16:40-16:44	Quarter pixel based random access image sensor for wide view imaging Takayuki Hamamoto, Satoshi Shimizu, Ryusuke Kawahara, Tokyo University of Science.
16:44-16:48	Analysis of the activation energy of dark current in CCD pixels Ralf Widenhorn, Morley M. Blouke, Alexander Weber, Armin Rest, Erik Bodegom, Portland State University.
16:48-16:52	CMOS APS Pixel Photoresponse Prediction for Scalable CMOS Technologies Igor Shcherback, Alexander Belenky, Orly Yadid-Pecht, Ben-Gurion University.
16:52-16:56	Backside-hybrid photodetector and image sensor for trans-chip detection of NIR light Takashi Tokuda, Yoshihisa Sakano, Keiichiro Kagawa, Jun Ohta, Masahiro Nunoshita, Nara Institute.
16:56-17:00	Image Sensor Architecture for Arbitrarily Directional Motion Detection Using Spacial Propagation Delay of Excitation Signal Junichi Akita, Misako Takayasu, Hideki Takayasu, Amane Koizumi, Future University Hakodate.
17:00-17:04	Anomalous annealing behavior of the high resistivity CCD irradiated at cold temperature G. Prigozhin, M. Bautz, S. Kissel, B. LaMarr, C. Grant, MIT.
17:04-17:08	A High Speed Digital Vision Chip with Multi-grained Parallel Processing Capability Takashi Komuro, Shingo Kagami, Masatoshi Ishikawa, University of Tokyo.
17:08-17:12	Charge Sensitive Elements Optimised for Particle Tracking Grzegorz Deptuch, LEPSI.
17:12-17:16	Brain slice imaging. A 100×100 pixel CIS combining 40K frames per second and 14 bit dynamic range Danny Scheffer, tom Walschap, F. Kubo, M. Ichikawa, FillFactory.
17:16-17:20	Source followed noise limitations in CMOS active pixel sensors K.M. Findlater, D.J. Baxter, R.K. Henderson, J.E.D. Hurwitz, L.A. Grant, STMicroelectronics.
17:20-17:50	Coffee break
17:50-18:50	Discussion Session
19:00-20:30	Dinner
20:30-21:30	Poster Viewing

Friday May 16th 2003

08:30-08:50	Improvement of photo-sensitivity and smear characteristics in a 2.8 um-square pixel IT-CCD image sensor Tohru Yamada, Hiroshi Tanaka, Ken Henmi, Masato Kobayashi, Horoyuki Mori, Yoshiaki Katoh, Yuji Miyata, Matsushita Electric Co.
09:00-09:20	CMOS Imager with Embedded Analog Early Image processor Christophe Basset, Pietro Perona, Guang Yang, Bedabrata Pain, Caltech.
09:20-09:40	An Ultra Low Noise High Speed CMOS Linescan Sensor for Scientific and Industrial Applications Boyd Fowler, Janusz Balicki, Dana How, Steve Mims, John Canfield, Michael Godfrey, Pixel Devices.
09:40-10:00	High Speed Photo Line Sensors M. Lehmann, M Richter, L. Cavalier, F. Lustenberger, N. Blanc, CSEM.
10:00-10:30	Coffee Break
10:30-10:50	Charge Transfer Noise and Lag in CMOS Active Pixel Sensors Eric R. Fossum.
10:50-11:10	A 1/2.7 optical format, 3M pixel and progressive scan PIACCD Hiroo Umetsu, Katsumi Ikeda, Shinji Uya, Noriaki Suzuki, Tetsuo Yamada, FujiFilm Microdevices.
11:10-11:25	First images with a Medipix2-Silicon detector assembly M. Campbell, E. Heijne, X. Llopart, L. Tlustos, CERN.
11:25-11:40	Measurement and Analysis of Pixel Geometric and Diffusion MTF Function Components in Photodiode APS Sensors Tracy Dutton, Jaewon Kang, Terrence Lomheim, Richard Boucher, Ralph Shima, Mark Nelson, Aerospace Corp.
11:40-12:00	A 35 mm 13.89 Million Pixel CMOS Active Pixel Image Sensor G. Meynants, B. Dierickx, A. Alaerts, D. Uwaerts, S. Cos, FillFactory.
12:00-14:00	Lunch Break
14:00-14:15	Pyramidal Architecture fo CMOS Image Sensor Faycal Saffih, Richard Hornsey, University of Waterloo.
14:15-14:30	Demonstration of a frequency-demodulation CMOS image sensor and its improvement of image quality K. Yamamoto, Y. Oya, K. Kagawa, J. Ohta, M. Nunoshita, K. Watanabe, Nara Institute.
14:30-14:45	A Wide Dynamic Range CMOS Image Sensor with Integration of Short-Exposure-Time Signals Masaaki Sasaki, Shoji Kawahito, Mitsuhito Mase, Yoshiaki Tadokoro, Toyohashi University.
14:45-15:00	A retinal prosthetic device using a CMOS image sensor employed with modified pulse frequency modulation J. Ohta, T. Furumiya, David C. Ng, A. Uehara, K. Kagawa, T. Tokuda, M. Nunoshita, Nara Institute.
15:00-15:15	A 30×34 Pixel CMOS Image Sensor for Optical 3D Time-Of-Flight Imaging (WITHDRAWN) O.M. Schrey, O. Elkhalili, R. Jeremias, P. Mengel, M. Meyer, L. Listl, W. Brockherde, B.J. Hosticka, Fraunhofer Institute.
15:15-15:30	Curved Focal Plane Arrays April Jewell, Shouleh Nikzad, Toddd jones, David L. Broen, Thomas J. Cunningham, JPL.
15:30-16:00	Coffee Break
16:00-19:00	Social Activity
19:00-21:00	Banquet + WKA

Saturday May 17th 2003

08:30-09:00	An 8.2-Megapixel, 10-bit, 60-fps, CMOS APS Steinar Iversen, J. Moholt, Johannes Solhusvik, Isao Takaynagi, Junichi Nakamura, Eric R. Fossum, M. Shirakawa, K. Mitani, M. Sugawara, Micron Technology.
09:00-9:20	A High S/N Ratio CMOS Image Sensor with Real Time Object Categorizing Function Shigetoshi Sugawa, Tomoyasu Tate, Koji Chiba, Koji Kotani, Tadahiro Ohmi, Tohoku University.
09:20-09:40	Low Power Two-Chip Image Sensor Solution for High-End Scientific Applications Markus Loose, Mark Farris, James Garnett, Donald Hall, Lester Kozlowski, Rockwell Scientific.
09:40-10:00	First Break
10:00-10:15	A Software-controlled Pixel-level A-D Conversion Method for Digital Vision Chips Shingo Kagami, Takashi Komuro, Masatoshi Ishikawa, University of Tokyo.
10:15-10:30	Dynamic Range Enlargement in CMOS Imagers with Buried Photodiode Vladimir Berezin, Ilia Ovsiannikov, Dmitri Jerdev, Richard Tsai, Micron Technology.
10:30-10:45	Design Considerations For large Area Professional DSC CCD Imager Output Amplifiers C .Draijer, W. Klaassens, H.l. Peek, B.G.M. Dillen, J.T. Bosiers, DALSA.
10:45-11:00	An Image-sensor-based optical receiver fabricated in a standard 0.35 um CMOS technology for mobile applications Keiichiro Kagawa, Tomoaki Kawakami, Hiroaki Asazu, Tomohiro Nishimura, Jun Ohta, Nunoshita Masahiro, Kunihiro Watanabe, Nara Institute.
11:00-11:20	Second break
11:20-12:00	A Two-Dimensional Array Imager Demonstrating Feedback Reset Suppresion of kTC Noise Thomas J. Cunningham, Bruce Hancock, Guang Yang, Monico Ortiz, Chris Wrigley, Suresh Seshadri, Bedabrata Pain, JPL.
12:00-12:20	A low power single chip VGA camera Laurens Korthout, Parikshit Kumar, Kees van der Sanden, Jan van Geloven, Adrie Mierop, Christophe Kefeder, Olivier Poulnais, Noud Boudewijns, Ton van Keeken, Philips Semiconductors.
12:20-12:40	High Dynamic Range Imaging using Combined Linear-Logarithmic Reponses from a CMOS Image Sensor FG.G Storm, J.E.D. Hurwitz, D. Renshaw, K.M. Findlater, R.K. Henderson, M.D. Purcell, University of Edinburgh.
12:40-13:00	Concluding remarks
13:00-14:00	Lunch