1991 IEEE Charge-Coupled Devices
(CCDs) Workshop
June
7·9, 1991
Waterloo, Canada
|
Savvas G.
Chamberlain University of Waterloo Waterloo, Canada |
# pages 10 |
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8.10 a.m. Sat. 1 |
Fabrication Techniques for CCD’s for Performance and Yield no hard copy Richard A. Bredthauer Loral Fairchild Newport Beach, CA 92658-8900 |
0 |
|
9.05 a.m. Sat. 2 |
Eric R. Fossum Jet Propulsion Laboratory (NASA) California Institute of Technology Pasadena, CA |
88 |
|
9.55 a.m. Sat. 3 |
Future Development for Thinned Back-illuminated CCD Imagers Chin-Ming Huang Lincoln Laboratory Massachusetts Institute of Technology Lexington, MA 02173-9108 |
32 |
|
11.05 a.m. Sat. 4 |
Low Noise Charge Sensing at the Output of a CCD K. Kandiah and F.B. Whiting Rutherford Appleton Laboratory Chilton Oxon OX11 OQX, United Kingdom. |
36 |
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12.00 noon Sat.5 |
Models of the back surface of thinned CCD’s Morley M. Blouke Tektronix Inc. Beaverton,OR 97077 |
14 |
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1.30 p.m. Sat. 6 |
CCD Device Development for use in High-speed sampled analog signal processing J. D. Strombosky,
R.H. Whiting, C.W. Christensen, D. McClure, R.L. Wixted Massachusetts Institute of Technology Lincoln Laboratory Lexington, MA 02173-0073 |
38 |
|
2.25 p.m. Sat. 7 |
Semiconductor Device Simulation for CCDs Using Drift-Diffusion and Hydrodynamic Formulations John R.F. McMacken,
Savvas G. Chamberlain Electrical and Computer Engineering Dept. University of Waterloo Waterloo, Ontario Canada N2L 301 |
89 |
|
3.30 p.m. Sat. 8 |
An Overview of the Schottky-Barrier Imager Technology Walter F. Kosonocky New Jersey Institute of Technology Newark, NJ 07102 |
26, 12 |
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4.25 p.m. Sat. 9 |
Design and performance considerations for CCD's in acousto-optical channelizers Stephen Strunk, William D. Washkurak DALSA INC. Waterloo, Ont. Canada N2V 2E9 |
41 |
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5.20 p.m. Sat. 10 |
Design of Solid-State Imaging Arrays Marvin H. White Lehigh University Bethlehem, PA 18015 |
38,30,20 |
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8.10 a.m. Sun. 1 |
A Review of Photo Detector Elements for Interline CCD T.R. Lee, B. C. Burkey Eastman Kodak Company Rochester, NY 14650-2008 USA |
76 |
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9.05 p.m. Sun. 2 |
Time Delay and Integration (TDI) Charge Coupled Device (CCD): Device design and applications Hon-Sum Philip Wong, Ying L. Yao, Eugene S. Schlig IBM Thomas J. Watson Research Center Yorktown Heights, NY 10598, USA. |
52 |
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10.00 a.m. Sun. 3 |
An MTF measurement technique for small Pixel Imagers Mike Marchywka*, Dennis G. Socker Naval Research Laboratory Washington, DC 20375-5000 *Interferometrics Inc. USA. |
18 |
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10.40 a.m. Sun. 4 |
Modulation Transfer Function (MTF) of CCD Imagers: Utility, Models, and Measurement Methods Terrence S. Lomheim The Aerospace Corporation Los Angeles, CA 90009-2957 |
42 |
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11.35 a.m. Sun. 5 |
Nobukazu Teranishi NEC Corporation 1120, Shimokuzawa, Sagamihara Kanagawa 229, Japan |
28 |
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690 |