WORKSHOP PAPER
Hybrid Optical Structure with 1x1 and 2x2 Micro-lens Mixed Array for Image Resolution Improvement
Gyeong Jin Lee1, Hyungeun Yoo1, Wooseok Choi1, Jina Kim1, Sangwoo Lee1, Sungho Gil1, Seunghyeok June1, Hyungchae Kim1, Yujeong Baek1, MinYoung Jung1, Junga Koh1, Wonjun Kang1, EuiYeol Kim1, Jungbin Yun1, Bumsuk Kim1, Kyungho Lee1
1System LSI Division, Samsung Electronics Co., Ltd., Hwaseong-si, Gyeonggi-do, Korea

Abstract

This study demonstrates a CMOS image sensor (CIS) with a hybrid optical structure which combines the benefits of Quad-cell and sparse AF optical structure. The hybrid structure has 1x1 micro-lenses to the green channel for low intra-channel signal differences (Ch diff) and better resolution and 2x2 micro-lenses to the red and blue channels for phase-detection auto-focus (PDAF). Serifs of micro-lens patterns are modified to reduce deformation caused by loading effects during micro-lens etching process. The hybrid structure shows improved sensitivity, signal-to-noise ratio (SNR), and intra-channel differences compared to Q-cell, with the green channel showing less than one-fifth of Ch diff than Q-cell. Measurements of the modulation transfer function (MTF) and real-image comparisons demonstrate that the hybrid structure provides better resolution and more detailed expression than Q-cell.
Year: 2025
Workshop: IISW
URL: https://doi.org/10.60928/1rb5-y027

Keywords

CMOS image sensor, hybrid optical structure, Quad-cell, sparse AF, micro-lenses, phase-detection auto-focus, sensitivity, signal-to-noise ratio, intra-channel differences, modulation transfer function, real-image comparisons, resolution improvement,

References

[1]) J. Lee et al., "0.6μm F-DTI based Quad-cell with Advanced Optic Technology for All-pixel PDAF and High Sensitivity/SNR performance", International Image Sensor Workshop (IISW) (2019), 2019
[2]) J. Pyo et al., "A Smart Dual Pixel Technology for Accurate and All-Directional Auto Focus in CMOS Image Sensors", International Image Sensor Workshop (IISW) (2021), 2021. https://doi.org/10.23919/vlsicircuits52068.2021.9492472
[3]) M. Wu et al., "Leakage in CMOS devices induced by pattern-dependent microloading effect", 2012 10th IEEE International Conference on Semiconductor Electronics (ICSE) (2012), 2012. https://doi.org/10.1109/smelec.2012.6417181