WORKSHOP PAPER
A CMOS Image Sensor with In-Pixel Temperature Sensors for Dark Signal Non-Uniformity Compensation
Shuang Xie1, Accel Abarca Prouza1, Albert Theuwissen1,2
1Electronic Instrumentation Laboratory, Delft University of Technology, Delft, the Netherlands
2Harvest Imaging, Bree, Belgium

Abstract

This paper presents a CMOS image sensor with in-pixel temperature sensors for dark signal non-uniformity (DSNU) compensation between -20 ⁰C and 80 ⁰C. Two types of in-pixel temperature sensors, based on a BJT or on the in-pixel source follower (SF) itself, are implemented, measured, and compared. Both temperature sensors achieve inaccuracies less than ±0.3 ⁰C, when measured on 3 test chips. Dark current measured on neighboring image pixels of the two types of temperature sensors shows that the SF based one incurs no penalty to the image sensor array, while the BJT based alternative can introduce 100 times more dark current to its surrounding pixels. Using the temperature information provided by the in-pixel temperature sensors, the average dark current can be predicted and compensated by at least 70% on 3 measured chips.
Publisher: IISS (Int. Image Sensors Society)
Year: 2019
Workshop: IISW
URL: https://doi.org/10.60928/215z-p8g8

Keywords

CMOS Image Sensor, In-Pixel Temperature Sensors, Dark Signal Non-Uniformity Compensation,

References

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