WORKSHOP PAPER
Temporal Noise Suppression Method using Noise -Bandwidth Limitation for Pixel -Level Single -Slope ADC
Sanggwon Lee1, Min-Woong Seo1, Masamichi Ito1, Sung-Jae Byun1, Hyukbin Kwon2, Daehee Bae1, Joosung Moon1, Gihwan Cho1, Heesung Shim1, Jae-Kyu Lee1, Chang-Rok Moon1, Hyoung-Sub Kim1
1Semiconductor R&D Center, Samsung Electronics Co., Hwasung-City, Gyung gi-do, 18848, Republic of Korea
2Semiconductor R&D Center,Samsung Electronics Co., Hwasung-City, Gyung gi-do, 18848, Republic of Korea

Abstract

This paper proposes a method for reducing temporal random noise in a pixel-level single-slope analog-to-digital converter of a global-shutter CMOS image sensor. By employing a noise-bandwidth limiting technique in the single-slope ADC circuit, a significant portion of thermal noise is filtered out, resulting in over 30% noise reduction compared with global shutter CMOS image sensors without the bandwidth limiting capacitor. This method is applied to a digital pixel sensor with a 4.95-µm pixel pitch and 2-megapixel resolution, demonstrating successful evaluation.
Publisher: IEEE
Year: 2023
Workshop: IISW
URL: https://doi.org/10.60928/8nwm-bxeg
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Keywords

CMOS Image sensor, global shutter, pixel-level ADC, noise bandwidth limitation, temporal random noise, flicker noise, thermal noise, single-slope ADC,

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