WORKSHOP PAPER
Low Noise Single-Slope ADC with Signal-Dependent Multiple Sampling Technique
Sanguk Lee1, Seunghyun Lee1, Bumjun Kim1, Seong-Jin Kim1
1Ulsan National Institute of Science and Technology, Ulsan, 44919, South Korea

Abstract

A low noise single-slope analog-to-digital converter (SS-ADC) is presented employing a signal-dependent multiple sampling scheme for low-light imaging and high-accuracy ranging. The SS-ADC adopts multiple ramps to convert the signal of a pixel several times to average out random noise of readout circuits, improving a signal-to-noise ratio without any penalty on a readout time. The prototype SS-ADC fabricated in standard 0.11 µm CIS process with an indirect time-of-flight pixel array improves a depth accuracy up to about 40% at a long distance.
Publisher: IISS (Int. Image Sensors Society)
Year: 2019
Workshop: IISW
URL: https://doi.org/10.60928/egvf-sfed
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Keywords

Low Noise, Single-Slope ADC, Multiple Sampling Technique,

References

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