WORKSHOP PAPER
The-State-of-the-Art of CMOS Image Sensors
Abstract
CMOS Image Sensors (CIS) have continued to evolve in response to performance requirements of current applications for Smartphone Imaging, Security & Surveillance, Biometrics, Automotive and Depth Sensing and Ranging. This paper presents the latest analysis and observed trends on CMOS image sensors in terms of resolution, pixel pitch, and silicon thickness. The latest PDAF and CFA observations are discussed, including pixel-level DBI. Trends on recent Near-Infrared (NIR) sensors and the current State-of-the-Art of back-surface NIR structures are also presented, alongside trends on Time-of-Flight (ToF) sensors for Front- and Back-illuminated image sensors.Keywords
CMOS Image Sensors, Pixel-pitch, Near-Infrared (NIR) sensors,References
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