WORKSHOP PAPER
A Novel Threshold Calibration Methodology for Quanta Image Sensors (QIS)
Dakota A. Starkey1, Jiaju Ma2, Saleh Masoodian2, Eric R. Fossum1
1Thayer School of Engineering, Dartmouth College, Hanover, NH, USA
2Gigajot Technology Inc., Pasadena, CA, USA

Abstract

A new characterization methodology for characterizing conversion gain and read noise in deep sub-electron read noise pixels using only a binary output data stream is proposed. This technique seeks to address the unique issue of calibrating the thresholding circuit in a single bit Quanta Image Sensor device without the need for a calibrated light source.
Publisher: IISS (Int. Image Sensors Society)
Year: 2019
Workshop: IISW
URL: https://doi.org/10.60928/jgbp-i3ce
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Keywords

Quanta Image Sensor, Photon-counting, Threshold Calibration,

References

1) E. R. Fossum, "What to do with sub-diffraction-limit (SDL) pixels?—A proposal for a gigapixel digital film sensor (DFS)", IEEE Workshop on Charge-Coupled Devices and Advanced Image Sensors, 2005
13) D. A. Starkey and E. R. Fossum, "Determining conversion gain and read noise using a photon-counting histogram method for deep sub-electron read noise image sensors", IEEE Journal of Electron Devices, 2016. https://doi.org/10.1109/jeds.2016.2536719