WORKSHOP PAPER
Detailed Characterization of SWIR-sensitive Colloidal Quantum Dot Image Sensors
Joo Hyoung Kim1, Vladimir Pejovic1,2, Epimitheas Georgitzikis1, Yunlong Li1, Pawel E. Malinowski1, Itai Liebermann1, David Cheyns1, Paul Heremans1,2, Jiwon Lee1
1imec, Kapeldreef 75, 3001 Leuven, Belgium
2KU Leuven, 3001 Leuven, Belgium

Abstract

Due to the weak responsivity of silicon imagers to photons with lower energy than 1.12 eV, thin-film image sensors are increasingly considered as potential alternatives. This study emphasizes the notable performance of lead sulfide (PbS) Colloidal Quantum Dot (CQD) photodetectors, highlighting their absorption wavelength tunability up to 2.6 µm and compatibility with CMOS processes. It presents detailed analyses of PbS CQD imagers, focusing on their exceptional shot-noise-limited behavior and Short-Wavelength-Infrared (SWIR) sensitivity, achieving an External Quantum Efficiency (EQE) of up to 40% at 1450 nm wavelength. The paper also discusses operation speed through image lag characterization, blooming suppression techniques, and the statistical analysis of activation energy for quantum dots using dark current spectroscopy.
Publisher: IISS (Int. Image Sensors Society)
Year: 2021
Workshop: IISW
URL: https://doi.org/10.60928/shca-s1o1

Keywords

Thin-film imager, PbS Colloidal Quantum Dot photodiode, SWIR-sensitive,

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