WORKSHOP PAPER
Near-infrared sensitivity enhancement of silicon photodiode with plasmonic grating
Koya Okazaki1, Nobukazu Teranishi2, Takahito Yoshinaga1, Atsushi Ono1,2
1Graduate School of Integrated Science and Technology, Shizuoka University, Hamamatsu, Japan
2Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan

Abstract

We have proposed plasmonic diffraction for enhancement of near-infrared (NIR) sensitivity in a silicon-based image sensor. Metal grating efficiently diffracted incident light into the silicon absorption layer. The silver grating structure was fabricated on a large-area silicon photodiode by a lift-off method. The 1.2-fold improvement in sensitivity by plasmonic diffraction was demonstrated at a NIR wavelength of 940 nm.
Year: 2025
Workshop: IISW
URL: https://doi.org/10.60928/z1cs-hi10

Keywords

plasmonic diffraction, near-infrared sensitivity, silicon-based image sensor, metal grating,

References

1) S. Yokogawa et al., "IR sensitivity enhancement of CMOS Image Sensor with diffractive light trapping pixels", Sci. Rep. 7(1), 3832 (2017), 2017. https://doi.org/10.1038/s41598-017-04200-y
2) T. Y. Lee et al., "Quantum Efficiency and Optical Cross-talk of Pixels with Backside Scattering Technique for Near-Infrared Imaging", International Image Sensor Workshop, R30 (2021), 2021
3) A. Ono et al., "Near-infrared sensitivity improvement by plasmonic diffraction for a silicon image sensor with deep trench isolation filled with highly reflective metal", Opt. Express 29(14), 21313 (2021), 2021. https://doi.org/10.1364/oe.428314
4) T. Yoshinaga et al., "Photon confinement in a silicon cavity of an image sensor by plasmonic diffraction for near-infrared absorption enhancement", Opt. Express 30(20), 35516 (2022), 2022. https://doi.org/10.1364/oe.472401
5) N. Teranishi et al., "Near-Infrared Sensitivity Enhancement of Image Sensor by 2ND-Order Plasmonic Diffraction and the Concept of Resonant-Chamber-Like Pixel", 2022 International Electron Devices Meeting (IEDM), San Francisco, CA, USA, 2022, pp. 37.2.1, 2022. https://doi.org/10.1109/iedm45625.2022.10019523