2001 IEEE Workshop on Charge-Coupled Devices and

Advanced Image Sensors

PROGRAM

Thursday, June 7

8:30 Opening Remarks:

Eric Fossum Sayed Eid Jerry Hynecek

Session 1. CMOS Sensors I

Chairman: Gary Hughes

9:00 A Micropower Self-Clocked Camera-on-a-Chip (12)

K.B. Cho¹, A. Krymski², E.R. Fossum²

¹Photobit Corporation, ²Photobit Technology Corporation

9:20 A 3.25M-pixel APS-C Size CMOS Image Sensor (16)

S. Inoue¹, K. Sakurai¹, I. Ueno¹, T. Koizumi¹, H. Hiyama¹, T. Asaba¹, S. Sugawa², A. Maeda³, K. Higashitani³, H. Kato³, K. Iizuka⁴, M. Yamawaki⁴

¹Canon Inc. Device Development Center, ²Department of Electronic Engineering, Graduate School of Engineering, Tohoku University, ³Mitsubishi Electric Corporation ULSI Development center, ⁴Mitsubishi Electric Corporation LSI Division

9:40 Dynamically Reconfigurable Vision CMOS Image Sensor

for Real-Time Staring Active Vision Systems (20)

G. Yang, C. Sun, C. Wrigley, D. Stack, C. Kramer, and B. Pain

Center for Space Microelectronic Technology,

JPL, California Institute of Technology

10:00 Morning Break

10:30 A High-Sensitivity Oversampling Digital Signal Detection Technique

for CMOS Image Sensors Using Non-Destructive Intermediate High-Speed Readout Mode (24)

S. Kawahito¹, N. Kawai², and Y. Tadokoro²

¹Research Institute of Electronics, Shizuoka University, ²Toyohashi University of Technology

10:45 A High Speed, 240 Frames/s 4 Megapixel CMOS Sensor (28)

A. Krymski, N. Bock, D. VanBlerkom, N. Tu, E.R. Fossum

Photobit Technology Corporation

11:00 A 640 x 480 CMOS Image Sensor for

High Speed Image Capture (32)

E.C. Fox, G.R. Allan, B. Li, D. Dattani, S. Kamasz, M.J. Kiik, Q. Tang, A. Pavlov, D. Dykaar, S.G. Ingram

DALSA Corp.

11:15 CMOS Image Sensor with CIF/QCIF Switching Function (36)

K. Hara, K. Simomura, Y. Endo, K. Okui, S. Komori, and K. Kyuma

Mitsubishi Electric Corporation

11:30 A New Image Sensor with Programmable Spatially Variant

Multiresolution Readout Capability (40)

Y. Ohtsuka, I. Ohta, and K. Aizawa

Department of Electrical Engineering, University of Tokyo

11:45 Lunch

Session 2. CMOS Sensors II & CMOS Sensor Technology I

Chairman: Dan McGrath

1:30 2/3” CMOS Imaging Sensor for High Definition Television (44)

M. Loose, L.J. Kozlowski, A.M. Joshi, A. Kononenko, S. Xue,

J. Lin, J. Luo, I. Ovsiannikov, J. Clarke, and T. Paredes

Rockwell Science Center

1:50 A Mega-Pixel High Speed CMOS Imager

with Sustainable Gigapixel/sec Readout Rate (48)

S. Lauxtermann¹, G. Izrael¹, P. Seitz¹, H. Bloss², J. Ernst²,

H. Firla², S. Gick²

¹Philips Semiconductors, ²CSEM

2:10 A CMOS Image Sensor with Non-Destructive Intermediate Readout

Mode for Adaptive Iterative Search Motion Vector Estimation (52)

D. Handoko¹, S.Kawahito¹, Y. Tadokoro², and A. Matsuzawa³

¹Shizuoka University, ²Toyohasi University of Technology,

³Matsushita Electric Industrial Co. Ltd.

2:30 Fixed Pattern Noise Suppression by a Differential Readout Chain

for a Radiation-Tolerant Image Sensor (56)

G. Meynants, J. Bogaerts, B. Dierickx, and D. Uwaerts

FillFactory

2:45 A CMOS Image Sensor Employing a Double Junction Photodiode (60)

K.M. Findlater¹, D. Renshaw¹, J.E.D. Hurwitz², R.K. Henderson²,

T.E.R. Bailey², J.M. Raynor²

¹Department of Electronics and Electrical Engineering,

The University of Edinburgh, ²ST Microelectronics Imaging Division

3:00 Afternoon Break

3:30 Small CMOS Pixel Design with Single Row Line (64)

V. Berezin, Photobit Corporation

3:45 A Crosstalk Study on CMOS Active Pixel Sensor Arrays

for Color Imager Applications (68)

C.C. Wang, C.G. Sodini

Department of Electrical Engineering and Computer Science, MIT

Session 3. CMOS & CCD Sensors, Poster Session

Chairman: Selim Bencuya

4:00 Poster Session Rules Explanation

4:15 A VGA ISIS for a Video Camera of 1,000,000 fps: A Proposal (72)

T. G. Etoh¹, H. Mutoh², C. Lohmann¹, and T. Reisinger¹

¹Kinki University, ²Link Research Corporation

4:20 Resolution Progress of Image Sensor Over Nyquist Rate

Using Digital Signal Processing and Optical Low-Pass Filter (76)

T. Kimura, H. Gotoh, M. Anodou, and H. Shiraki

Department of Systems Engineering, Ibaraki University

4:25 Radiation Hardness Study of an APS CMOS Particle Tracker (80)

W. Dulinski

LEPSI IN2P3/ULP

4:30 Hexagonal Array Processing (83)

M.D. Purcell¹, D. Renshaw¹, K.M. Findlater¹, J.E.D. Hurwitz²,

S.G. Smith², T.E.R. Bailey²

¹Department of Electronics and Electrical Engineering

The University of Edinburgh, ²ST Microelectronics Imaging Division

4:35 Dual Mode Active Pixel Sensor with Focal Plane Edge Detection (87)

M. Tabet and R.I. Hornsey

Department of Electrical & Computer Engineering, University of Waterloo

4:40 Design and Development of a Compact Gamma Camera

for the Detection of Malignant Sentinel Lymph Nodes (91)

D. Lowe, A. Truman, A. Bergman, and H.L. Kwok

Department of ECE, University of Victoria

4:45 Charge Sharing Modeling in Pixel Detectors

with Capacitive Charge Division (95)

J. Marczewski¹, D. Tomaszewski¹, K. Domanski¹, P. Grabiec¹,

M. Caccia², S. Borghi³, and R Campagnolo³, W. Kucewicz⁴

¹Institute of Electron Technology, Warsaw,

²Universita ‘dell’Insubria and INFN,

³Universita’degli Studi di Milano and INFN, ⁴University of Mining and Metallurgy, Krakow

4:50 Characterization Methodology for Micro-Lens Performance

in CMOS Image Sensors (99)

V. Korobov, C. Cork, H. Wolf, S. Fainleib

TOWER Semiconductor LTD.

4:55 Low Dark-Current CCD Register

Driven from Back Electrodes Through Barrier (103)

H. Shiraki and T. Kimura

Ibaraki University

5:00 Improved One-Dimensional Analysis of CMOS Photodiode

Including Epitaxial-Substrate Junction (106)

J.S. Lee, R.I. Hornsey

Department of Electrical and Computer Engineering,

University of Waterloo

5:05 Characterization of Pixel Response Time and Image Lag

in CMOS Sensors (110)

S. Ramaswami, S. Agwani, L. Loh, N. Bossemeyeer

Image Capture Operation, Motorola Inc.

5:10 Custom Imager as Wavefront Sensor (114)

D.W. deLimaMonteiro, G. Vdovin

ITS/DIMES, Delft University of Technology

5:15 Short Evening Break

5:30 Discussion Session

Coordinator: Orly Yadid-Pecht

6:30-8:00 Dinner

Session 4. Poster Viewing

Coordinator: Orly Yadid-Pecht

8:00-9:00 All poster paper authors should attend their displays

Friday, June 8

Session 5. CMOS Sensor Technology II

Chairman: J.E.D. Hurwitz

8:30 A Four-Transistor Capacitive Feedback Reset Active Pixel

and its Reset Noise Reduction Capability (118)

I. Takayanagi, Y. Fukunaga, T. Yoshida, and J. Nakamura

Advanced Technology Research Center, Olympus Optical Co., Ltd.

8:50 Effects of Hydrogen Annealing on 0.25-um CMOS Image Sensor (122)

D.N. Yaung, S.G. Wuu, H.C. Chien, C.H. Tseng, and C.S. Wang

Taiwan Semiconductor Manufacturing Company

9:10 CMOS Difference Imager with Charge-Leakage Compensation

& Sum Output (125)

S. Seshadri, G. Yang, M. Ortiz, C. Wrigley, and B. Pain

Center for Space Microelectronics Technology, JPL,

California Institute of Technology

9:30 Analysis of APS Readout Circuit Delay (129)

K. Salama and A. ElGamal

Department of Electrical Engineering Stanford University

9:45 Crosstalk and Sub-Pixel Distribution of Sensitivity

in Color CMOS Image Sensor (133)

G. Agranov, V. Berezin, R.H. Tsai

Photobit Corporation

10:00 Morning Break

10:30 A High Dynamic Range CMOS APS Image Sensor (137)

Y. Wang, S.L. Barna, S. Campbell, and E.R. Fossum

Photobit Technology Corporation

10:50 A 192 x 124 CMOS Image Sensor

with Pixel Parallel Temporal Computing Architecture (141)

S. Yoshimura, T. Sugiyama, K. Yonemoto, K. Ueda

Sony-Kihara Research Center, Inc.

11:10 A 6.6M Pixel CMOS Image Sensor for

Electrostatic PCB Inspection (145)

D. Scheffer¹, G. Meynants¹, B. Dierickx¹, T. Fujii²

¹FillFactory, ²OHT Inc.

11:30 Inverted Logarithmic Active Pixel Sensor with Current Readout (149)

C.S. Hong, R.I. Hornsey

Department of Electrical and Computing Engineering,

University of Waterloo

11:45 kTC Noise Cancellation Pixel (153)

R.B. Merrill, Foveon, Inc.

12:00 Lunch

Session 6. CMOS Sensor Technology III

Chairman: Paul K. Lee

1:30 CMOS Active Pixel Sensor with In-Pixel Contrast Stretching (157)

C.S. Hong, R.I. Hornsey

Department of Electrical and Computer Engineering,

University of Waterloo

1:45 Differential Mode CMOS APS

for Optically Programmable Gate Array (OPGA) (161)

S.U. Ay^1,3, S. Barna², E.R. Fossum¹

¹Photobit Technology Corporation, ²Photobit Corporation

³Department of Electrical Engineering-Electrophysics,

University of Southern California

2:00 Column Parallel A/D Conversion on CMOS Image Sensor (165)

T. Hamamoto, T. Wakamatsu, N. Inokihara, K. Aizawa

Science University of Tokyo

2:15 Empirical CMOS APS MTF Modeling (169)

I. Shcherback, O. Yadid-Pecht

Ben-Gurion University

2:30 CMOS Photodiodes with Substrate Openings

for Higher Conversion Gain in Active Pixel Sensors (173)

J.S. Lee, R.I. Hornsey

Department of Electrical and Computer Engineering,

University of Waterloo

2:45 How to Design CMOS APS for Particle Tracking (176)

G. Deptuch

IReS IN2P3/ULP

Session 7. Workshop Social Activity

Coordinator: Sayed Eid

3:00-7:00 Boat Cruise

7:00-8:30 Dinner

Session 8. CMOS Sensor Applications

Chairman: Bart Dierickx

8:30 CMOS Sensor for the Detection of Minimum Ionizing Particles (180)

R. Turchetta¹, C. Didcot²

¹Rutherford Appleton Laboratory, ²OX11, 0QX

8:45 Development of CMOS Image Sensor Overlaid with a HARP

Photoconversion Layer (184)

T. Hayashida, M. Yamaguchi, M. Kosugi, T. Watabe, Y. Ishiguro,

K. Moroboshi, H. Ohtake, H. Kokubun, T. Watanabe, K. Tanioka

NHK Science & Technical Research Laboratories

9:00 A Retina/V1 Simple Cell Chip for Physiology Experiment

Design or Classroom Demonstration (188)

T. Delbruck, S. Bovet, E. Chicca, S.C. Liu, G.M. Ricci

Institute for Neuroinformatics (INI)

Saturday, June 9

Session 9. Walter Kosonocky Award

Chairman: Albert Theuwissen

8:30 Walter Kosonocky Award Paper Presentation (192)

Session 10. CCD Image Sensors and Other Imaging Devices

Chairman: Gareth Ingram

9:00 A Color Image Sensor with 9um Pixels

for High-End Digital Still Photography (193)

C. Draijer, G. Kreider, B. Dillen, W. Klaassens, H. Peek, A. Theuwissen

Philips Semiconductors Image Sensors

9:20 Impactron-A New Solid State Image Intensifier (197)

J. Hynecek, ISETEX, Inc.

9:40 3.4M Pixel TDI Image Sensor for

Confocal Scanning Microscopy (201)

I. Itoi, Y. Miura, S. Okamura, S. Kashima, H. Shibuya

Texas Instruments Japan Ltd.

9:55 The Perfect Imager for Digital Still Cameras (205)

J. Bosiers, E. Roks

Philips Semiconductors Image Sensors

10:10 Enhanced Full Well for Vertical Antiblooming,

High Sensitivity Time-Delay and Integration (TDI) CCDs

with GHz Data Rates (209)

S.R. Kamasz, S.P. Singh, S.G. Ingram, M.J. Kiik, Q. Tang, B. Benwell

DALSA, Inc.

10:25 Morning Break

10:45 Dual Linescan Architecture for High Responsivity

and Low Photon Shot Noise (213)

N. O

DALSA, Inc.

11:00 Ultra-High-Sensitivity New Super-HARP Pickup Tube (216)

K. Tanioka¹, Y. Ohkawa¹, K. Miyakawa¹, S. Suzuki¹, T. Takahata¹,

N. Egami¹, K. Ogusu², A. Kobayashi², T. Hirai², T. Kawai²

¹NHK Science & Technical Research Laboratories

²Hamamatsu Photonics, K.K.

11:15 Correction of Radiation Damage in the Chandra X-ray CCDs (220)

G. Prigozhin, M. Bautz, S. Kissel, B. LaMarr, G. Ricker

Center for Space Research, MIT

11:30 An Ultra-High-Speed Camera with an In-situ Storage Image Sensor

for Preliminary Test (224)

D. Poggemann¹, T.G. Etoh¹, A. Ruckelshausen¹, G. Kreider²,

A. Theuwissen², Y. Kondo³, H. Maruno³, K. Takubo³, and H. Soya³

¹Department of Electrical Engineering and Computer Sciences,

University of Applied Sciences Osnabrueck,

²Philips Semiconductors,

³Shimadzu Corporation

11:45 High Burst Rate CCDs

Capable of Imaging at > 1 Million Frames Per Second (228)

P. Swain, R. Kabra, V. Patel, M. Bhaskaran, J. Andrews,

P. Levine, J. Tower

Sarnoff Corporation

12:00 Concluding Remarks

Eric Fossum

12:15 Adjourn